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Term paper on atomic force microscope

ACKNOWLEDGEMENT

Hereby, I would like to take the opportunity to thank a no. of people who helped me out in my hour of need. These people really took a toll while
working with me on this term-paper and helping me out when I was really struck at times. Sincere thanks to our library staff, who always provided us with their deep knowledge on various subjects and books. And to our subject teacher, who was always available with her kind remarks and suggestions.


INTRODUCTION :

The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the, was developed by Gerd Binning  and Heinrich Rohrer in the early 1980s, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first AFM in 1986. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning.


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